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Publications

2010

  • “Characterization of MEMS Piezoresistive Pressure Sensor using AFM,” S. K. Patil, Z. Çelik, and D. P Butler, accepted for publication in Ultramicroscopy on January 20, 2010.
  • “Degradation in MOSFET Multi-stack High-k Gate Dielectrics due to Hot Carrier and Constant Voltage Stress,” Z. Çelik, and M. S. Shahriar, INVITED, 217th Electrochemical Society Meeting, Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing, April, 26-18, 2010, Vancouver, BC Canada.
  • “Self packaged MEMS Device,”  M. S. Rahman, M. Chitteboyina, Z. Çelik, D. P. Butler, S. Pacheco, and R. McBean, Int. Microelectronics Packaging Society, 6th Int. Conf. and Exhib..on Device Packaging, March 8 – 11, 2010, Scottsdale, Arizona.

2009

  • “A Low Frequency Noise Model for Multi-Stack Gate MOSFETs,” S. V. Devireddy, Z. Çelik, H.-H. Tseng, P. Tobin, and A. Zlotnicka, Microelectronics Reliability, vol. 49, pp. 103–112, 2009.
  • “Hot Carrier and Constant Voltage Stress Induced Low Frequency Noise in Nitrided High-k Dielectric MOSFETs,” M. S. Rahman, Z. Çelik, Tanvir Morshed, M. A. Quevedo-Lopez, A. Shanware and L. Colombo, IEEE Transactions on Device and Materials Reliability, vol. 9, pp. 203-208, 2009 .
  • “A New 1/f Noise Model for Multi-Stack Gate Dielectric MOSFETs,” Z. Çelik, INVITED, Proc. 20th International Conference on Noise and Fluctuations, p. 249, June 14-19, 2009; Pisa, Italy.
  • “A Low Frequency Noise Degradation in 45 nm High-k nMOSFETs due to Hot Carrier and Constant Voltage Stress,’ M. S. Rahman, Z. Çelik, M.A. Quevedo-Lopez, A. Shanware, and L.Colombo, Proc. 20th International Conference on Noise and Fluctuations, p. 263, June 14-19, 2009; Pisa, Italy.
  • “Failure Assessment in Aerospace Systems via Integrated Multi-Functional Sensors,” İ. E. Gönenli, Z. Çelik, and D. Butler, Proc. Nanoelectronics Devices for Defense and Security Conference, Sept 27 – Oct 2, 2009, Fort Lauderdale, FL.
  • “Nanocrystalline Piezoresistive Polysilicon Film By Aluminum Induced Crystallization For Pressure Sensing Applications,” S. Kumar Patil, Z. Çelik, and D. P. Butler, Proc. Nanoelectronics Devices for Defense and Security Conference, Sept 27 – Oct 2, 2009, Fort Lauderdale, FL.
  • “Nano-Bio Interface: best of Two Worlds,” IEEE-EDS Distinguished Lecture, Koç University, Istanbul, Turkey, June 23, 2009.
  • “Nanotechnology: Present and Future,” IEEE-Student Professional Awareness Conf., University of Texas at Arlington, April 10, 2009.

2008

  • “Effect of Nitrogen Incorporation on 1/f Noise Performance of MOSFETs with HfSiON Dielectric,” M. S. Rahman, T. Morshed, S. P. Devireddy, Z. Çelik, M. A. Quevedo-Lopez, A. Shanware and L. Colombo, Journal of Applied Physics, vol. 103, p. 033706, 2008.
  • “Physics-Based 1/f Noise Model for MOSFETs with Nitrided High‑κ Gate Dielectrics,” T. H. Morshed, S. P. Devireddy, Z. Çelik, A. Shanware, K. Green, J. J. Chambers, M. R. Visokay and L. Colombo, Solid-State Electronics, vol. 52, pp 711–724, 2008.
  • “Micromachined Nanoporous Membranes for Blood Oxygenation Systems,” V. Ambravaneswaran, S. Uttamaraj, Z. Çelik, R. C. Eberhart, C. J. Chuong, R. E. Billo and M. A. Savitt, Proc. IEEE 8th Int. Conference on Nanotechnology, August 18-21, 2008; Arlington, TX.
  • “Microcrystalline Piezoresistive Polysilicon Film Obtained by Aluminum Induced Crystallization,” S. K. Patil, Z. Çelik and D. P. Butler, Proc. IEEE 8th Int. Conference on Nanotechnology, August 18-21, 2008; Arlington, TX.
  • “A New Low Frequency Noise Model for Multi-Stack Gate MOSFETs and Conformal Electronics,” University of Virginia – Eminent Speakers Colloquium – October 24, 2008.
  • “Nanotechnology in the US: Focuses and Trends,” Promoting Advanced Materials Across Atlantic, Wallonia Technology Workshop, Automation Robotics Research Institute, Fort Worth, TX, October 15, 2008.
  • “Self-Packaged Flexible Electronics,” UNAM (Ulusal Nanoteknoloji Araştirma Merkezi), Bilkent University, Ankara, Turkey, May 16, 2008
  • “Self-Packaged MEMS Sensors,” METU-MET Center (Middle Eastern Technical University — Mass Microelectronics Production Plant for Microsystems and MEMS), Ankara, Turkey, May 15, 2008.
  • “Self-Packaged Flexible Electronics,” IEEE-EDS Distinguished Lecture, Koç University, Istanbul, Turkey, May 14, 2008.
  • “Low Temperature Piezoresistive Polysilicon Films for Pressure Sensors on Flexible Substrates,” Bogazici University, Istanbul Turkey, May 13, 2008.

2007

  • “Smart Skin: Multifunctional Sensor Arrays on Flexible Substrates,” Z. Çelik and D. P. Butler, Invited, Encyclopedia of Nanoscience and Nanotechnology, Edited by H. S. Nalwa, Editor-in-Chief, Journal of Nanoscience and Nanotechnology, American Scientific Publishers, accepted for publication on May 29, 2007.
  • “Smart Skin,” Z. Çelik and D. P. Butler, Invited in McGraw-Hill 2007 Yearbook of Science & Technology. ISBN-10: 007148647X ISBN-13: 978-0071486477
  • “A device-level vacuum-packaging scheme for microbolometers on rigid and flexible substrates,” A. Mahmood, D. P. Butler and Z. Çelik, IEEE Sensors Journal, vol. 7, pp. 1012-1019, 2007.
  • “Improved Low Frequency Noise Characteristics of Sub-micron MOSFETs with TaSiN/TiN Gate on ALD HfO2 Dielectric,” S. P. Devireddy, B. Min and Z. Çelik, F. Wang, A. Zlotnicka, H. H. Tseng and P. J. Tobin, Microelectronics Reliability, vol. 47, pp. 1228-1232, 2007.
  • “A New Model for 1/f Noise in High-κ MOSFETs,” T. Morshed, S. P. Devireddy, M. S. Rahman, Z. Çelik, H.-H. Tseng, A. Zlotnicka, A. Shanware, K. Green, J. J. Chambers, M. R. Visokay, M.A. Quevedo-Lopez and Luigi Colombo, IEEE 2007 International Electron Devices Meeting (IEDM) Technical Digest, pp. 561-564 , 2007.
  • “Effect of Nitrogen Incorporation Methods on 1/f Noise and Mobility Characteristics in HfSiON NMOSFETs,” M. S. Rahman, T. Morshed, S. P. Devireddy, M.A. Quevedo-Lopez, A. Shanware, L. Colombo, and Z. Çelik, Proc. 19th International Conference on Noise and Fluctuations, p. 25, September 9-14, 2007; Tokyo, Japan.
  • “Low Frequency Noise Characterization of TaSiN/HfO2 MOSFETs Below Room Temperature,” Z. Çelik, S. V. Devireddy, T. Morshed, S. Rahman, H.-H. Tseng, P. Tobin and A. Zlotnicka, INVITED, Proc. 19th International Conference on Noise and Fluctuations, p. 19, September 9-14, 2007; Tokyo, Japan.
  • “Variable Temperature Characteristics of Devices With HfSiON as The High-κ Dielectric on Nitrided Silicate (SiON) Interfacial Layer,” T. H. Morshed, Z. Çelik, S. P. Devireddy, M. S. Rahman, A. Shanware, K. Green, J. J. Chambers, M. R. Visokay and L. Colombo,, Proc. 19th International Conference on Noise and Fluctuations, p. 281, September 9-14, 2007; Tokyo, Japan.
  • “A Nanoscale Membrane Oxygenator: Rationale, Design and Preliminary Findings,” R. C. Eberhart, K. Ambravaneswaran, B. Thomas, J. Wright, C. Chapman, Z. Çelik, C. Chuong, R. Billo, R. Timmons, Society for Biomaterials Annual Meeting, Chicago, IL, April 18-21, 2007.
  • “Integrated Multi-functional Sensors for Failure Prognosis in Aerospace Systems,” Z. Çelik, D. P. Butler and J. R. Lackey, Strategic Partnership for Research in Nanotechnology (SPRING) Workshop IV, University of Houston, Houston, TX, Feb. 6-7, 2007.
  • “Nano-Bio Research at UTA,” Z. Çelik, Texas-Korea Nano Workshop, University of Texas at Dallas, Dallas, TX, August 6-8, 2007.
  • “Self-Packaged Flexible MEMS,” Z. Çelik and D. P. Butler, 2007 Transpacific Workshop on Flexible Electronics,” University of Texas at Dallas, Dallas TX, December 3, 2007.
  • “Vacuum Packaged RF MEMS Resonator,” M. M. Chitteboyina, D. P. Butler, S. P. Pacheco, R. V. McBean, Semiconductor Research Corporation TECHCON, Austin, TX, September 10-12, 2007.
  • “A New Low Frequency Noise Model for Multi-Stack Gate MOSFETs,” IEEE-EDS Distinguished Lecture, NJIT, Newark, NJ, November 14, 2007.
  • “A New Low Frequency Noise Model for Multi-Stack Gate MOSFETs,” IEEE-EDS Distinguished Lecture, SEMATECH, Austin, TX, March 22, 2007.
  • “Noise Modeling at Quantum Level for Advanced CMOS Technologies,” Texas Instruments Grantees Conference, Dallas TX, January 9, 2007.

2006

  • “Dependence of Low Frequency Noise in SiGe Heterojunction Bipolar Transistors on the Dimensional and Structural Features of Extrinsic Regions,” M. M. Ul Hoque, Z. Çelik, S. Martin, C. Knorr and C. Bulucea, Solid State Electronics, vol. 50, pp. 1430-1439, 2006.
  • “Flexible Sensors: a Review,” Z. Çelik and D. P. Butler, J. Nanoelectronics and Optoelectronics, vol. 1, pp. 194-202, 2006.
  • “Impact of Interfacial Layer on Low Frequency Noise of HfSiON Dielectric MOSFETs,” B. Min, S. P. Devireddy, Z. Çelik, A. Shanware, L. Colombo, K. Green, J. J. Chambers, M. R. Visokay, and A.L.P. Rotondaro, IEEE Transactions on Electron Devices, vol. 53, pp. 1459-1466, 2006.
  • “Low Frequency Noise in TaSiN/ HfO2 nMOSFETs and the Effect of Stress Relieved Pre-Oxide Interfacial Layer” S. P. Devireddy, B. Min, Z. Çelik, H.-H. Tseng, P. Tobin, F. Wang and A. Zlotnicka, IEEE Transactions on Electron Devices, vol. 53, pp. 538-544, 2006.
  • “Micromachined Bolometers on Polyimide,” A. Mahmood, Z. Çelik, and D. Butler, Sensors and Actuators A, vol. 132, pp. 452-459, 2006.
  • “Micromachined Integrated Pressure-Thermal Sensors on Flexible Substrates,” V. Shamanna, S. Das, Z. Çelik, D. P. Butler, and K. L. Lawrence, Journal of Micromechanics and Microengineering vol. 16, 1984-1992, 2006.
  • “Low frequency noise and mobility degradation mechanisms in high-k MOSFETs,” S. P. Devireddy, Z. Çelik, H.-H Tseng, and A. Zlotnicka, 3rd Int. Symp. Advanced Gate Stack Technology, Austin TX, Sept. 27-29, 2006.
  • “Fabrication of a Nanoscale, Nanoporous Membrane Oxygenator,” C.-Y. Ko1, V. Ambravaneswaran, Z. Çelik, R. E. Billo, C-J. Chuong, R. B. Timmons and R. C. Eberhart, Southwestern Medical Center, Dallas, TX, June 7, 2006.
  • “Nanotechnology Research at UTA,” UTA Retirees Club, University of Texas at Arlington, Arlington TX, May 6, 2006.
  • “Nano-Bio Interface,” BIODFW Regional Alliance, Southwestern Medical Center, Dallas TX, April 20, 2006.
  • “Self-Packaged Flexible Electronics,” NanoTX, Dallas Convention Center, Dallas TX, September 28, 2006.
  • “Self Packaged Flexible Electronics, IEEE-EDS Distinguished Lecture, Tempe AZ, January 13, 2006.
  • “Smart Skin: Multisensory Arrays on Flexible Substrates,” Freescale Semiconductor Co., Tempe, AZ, January 13, 2006.
  • “Noise Modeling at Quantum Level for Advanced CMOS Technologies,” Texas Instruments Grantees Conference, Dallas TX, January 6, 2006.

2005

  • “1/f Noise in PNP Polysilicon Emitter Bipolar Transistors,” M. M. Ul Hoque, Z. Çelik, J. Trogolo, D. Weiser and K. Green, Journal of Applied Physics, vol. 97, p. 084501, 2005.
  • “Low Frequency Noise Characteristics of HfSiON Gate-Dielectric MOSFETs,” B. Min, S. P. Devireddy and Z. Çelik, L. Colombo, A. Shanware, K. Green, J. J. Chambers and M. R. Visokay, Applied Physics Letters, vol. 86, p. 082102, 2005.
  • “Micromachined Infrared Bolometers on Flexible Polyimide Substrates,” S. A. Dayeh, D. P. Butler and Z. Çelik, Sensors and Actuators vol. A118, pp. 49-56, 2005
  • “Comparison of 1/f noise in complementary NPN and PNP polysilicon emitter bipolar transistors,” M. M. Hoque, Z. Çelik Butler, J. Trogolo, D. Weiser and K. Green, Proc. SPIE Fluctuations and Noise, Noise in Devices and Circuits, vol. 5844, pp. 120-131, Austin, TX, May 24-26, 2005.
  • “Device-level vacuum packaged micromachined infrared detectors on flexible substrates” A. Mahmood, D. P. Butler, Z. Çelik, Proc. IEEE Sensors Conf, pp-1153-1156., Irvine, CA, Oct. 31 – Nov 3, 2005.
  • “Different Noise Mechanisms in High-k Dielectric Gate Stacks,” Z. Çelik, INVITED, Proc. SPIE Fluctuations and Noise, Noise in Devices and Circuits, vol. 5844, pp. 177-184, Austin, TX, May 24-26, 2005.
  • “Effect of base/collector implant and emitter-poly overlap on low frequency noise in SiGe HBTs,” M. M. Ul Hoque, Z. Çelik, S. Martin, C. Knorr and C. Bulucea, Proc. 18th International Conference on Noise and Fluctuations, pp. 261-264, September 19-23, 2005; Salamanca, Spain.
  • “Flicker Noise characteristics of MOSFETs with HfO2, HfAlOx and Al2O3/HfO2 gate dielectrics,” S. P. Devireddy, B. Min, Z. Celik Butler, F. Wang, A. Zlotnicka, H.-H. Tseng, and P. J. Tobin, Proc. SPIE Fluctuations and Noise, Noise in Devices and Circuits, vol. 5844, pp. 208-217, Austin, TX, May 24-26, 2005.
  • “Flicker Noise in Nitrided High-k Dielectric NMOS Transistors,” B. Min, S. V. Devireddy, Z. Celik Butler, A. Shanware, K. Green, J. Chambers, M. Visokay, L. Colombo, Proc. SPIE Fluctuations and Noise, Noise in Devices and Circuits, vol. 5844, pp. 31-40, Austin, TX, May 24-26, 2005.
  • “Low frequency noise characteristics of TaSiN/HfO2/SRPO SiO2 MOSFETs,” S. P. Devireddy, Z. Çelik, H.-H. Tseng, P. J. Tobin, F. Wang and A. Zlotnicka, Proc. 18th International Conference on Noise and Fluctuations, pp. 311-314, September 19-23, 2005; Salamanca, Spain.
  • “Micromachined Infrared Sensors with Device-Level Encapsulation” A. Dave, Z. Çelik and D. P. Butler, Proc. SPIE Defense and Security Symposium; Infrared Technology and Applications XXXI, vol. 5783, pp. 460-479, Orlando, FL, March 28 – April 1, 2005.
  • “Measurements and Modeling of Low-Frequency Noise in Advanced CMOS and Bipolar Technologies,” Semiconductor Research Corporation e-Workshop, May 19, 2005.
  • “Noise and Reliability of High-k Dielectric Stacks,” IEEE Metrocon, Fort Worth TX, September 14, 2005.

2004

  • “Effect of Interfacial Oxide Thickness on 1/f Noise in Polysilicon Emitter BJTs,” M. M. Hoque, Z. Çelik, D. Lan, D. Weiser, J. Trogolo, and K. Green, IEEE Transactions on Electron Devices vol. 51, pp. 1504-1513, 2004.
  • “Flexible Microbolometers Promise Smart Fabrics with Imbedded Sensors,” A. Mahmood, D. P. Butler and Z. Çelik, Laser Focus World, pp. 99-103, April, 2004.
  • “Low-Frequency Noise in Sub-Micron MOSFETs with HfOx, HfO2/Al2O3 and HfAlOx Gate Stacks,” B. Min, S. P. Devireddy, Z. Çelik, F. Wang, A. Zlotnicka, H. H. Tseng and P. J. Tobin, IEEE Transactions on Electron Devices vol. 51, pp. 1679 – 1687, 2004.
  • “Microbolometers on a Flexible Substrate for Infrared Detection,” A. Yildiz, Z. Çelik, D. P. Butler, IEEE Sensors Journal, vol. 4, pp. 112-117, 2004.
  • “Origin of 1/f Noise in Lateral PNP Bipolar Transistors,” E. Zhao, Z. Çelik, F. Thiel and R. Dutta, Microelectronics Reliability, vol. 44, pp. 89-94, 2004.
  • “Wafer Level Self-Packaged Infrared Microsensors,” A. Dave, A. Mahmood, Z. Çelik and D. P. Butler, Proc. SPIE Defense and Security Symposium; Infrared Technology and Applications XXX, vol. 5406, pp. 473-482, Orlando, FL, April 12-16, 2004.
  • “Device level vacuum packaged micromachined microbolometers on flexible substrates,” A. Mahmood, D. P. Butler and Z. Çelik, TEXMEMS VI, Texas A&M University, Texas, Sept. 9th, 2004.
  • “Integrated Pressure and Infrared Sensors on Flexible Substrates for Smart Skin Applications,” S. Das, V. Shamanna, Z. Çelik and D. P. Butler, TEXMEMS VI, Texas A&M University, Texas, Sept. 9th, 2004.
  • “Surface Micromachined Infrared Microsensors with Wafer-Level Encapsulation,” Aasutosh Dave, Z. Çelik and D. P. Butler, TEXMEMS VI, Texas A&M University, Texas, Sept. 9th, 2004.
  • “Progress Report on Strategic Partnership for Research in Nanotechnology (SPRING), UTA,” Air Force Office of Scientific Research Program Review, Morgantown WV, August 5, 2004.
  • “Smart Skin: Multifunctional Sensory Arrays on Flexible Substrates,” Strategic Partnership for Research in Nanotechnology (SPRING) Workshop II, University of Texas at Dallas, November 12, 2004
  • “Smart Skin,” Mid-Cities Technical Club Meeting, Arlington, TX, March 3, 2004

2003

  • “Crystallization and Pyroelectric Effect of Semiconducting YBaCuO Thin Films Deposited on Substrates at Different Temperatures,” A. Yildiz, D. Butler, Z. Çelik and, C.-U. Kim, Journal of Vacuum Science and Technology B, vol. 21, pp. 837-842, 2003.
  • “Model for Random Telegraph Signals in Sub-Micron MOSFETs,” N. V. Amarasinghe, Z. Çelik, F. Wang and A. Zlotnicka, Solid State Electronics, vol. 47, pp. 1443-1449, 2003.
  • “Crystallization and Pyroelectric Effect of Semiconducting YBaCuO Thin Films Deposited on Substrates at Different Temperatures,” A. Yildiz, D. Butler, Z. Çelik and, C.-U. Kim, Virtual Journal of Applications of Superconductivity, April 1, 2003.
  • “1/f Noise and RTS in Advanced Bipolar Technologies,” Z. Çelik, MD M. Hoque, E. Zhao, D. Lan, D. Weiser, K. Green, J. Trogolo, INVITED, SPIE Fluctuations and Noise, Noise in Devices and Circuits, Santa Fe, NM, June 1 – 4, 2003, Proc. SPIE vol. 5113, pp. 120-132, 2003, Ed: M. J. Deen, Z. Çelik and M. E. Levinshtein.
  • “Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices,” Z. Çelik, INVITED, NATO-Advanced Research Workshop, Brno University of Technology, Czech Republic, August 14-16, 2003.
  • “Micromachined Infrared Sensor Arrays on Flexible Polyimide Substrates,” A. Mahmood, S. Dayeh, D. P. Butler and Z. Çelik, IEEE International Conference on Sensors, Toronto, Canada, October 22 – 24, 2003.
  • “Micromachined Infrared Sensor Arrays on Flexible Polyimide Substrates,” A. Mahmood, S. Dayeh, D. P. Butler, and Z. Çelik, IEEE Emerging Telecommunication Technologies Symposium, Richardson, TX, September 26-27, 2003.
  • “Modeling of RTS in Nanoscale MOSFETs” Z. Çelik, E. Zhao, F. Thiel, and R. Dutta, 17th International Conference on Noise and Fluctuations, pp. 313-316, Prague, Czech Republic, August 18-22, 2003.
  • “Temperature Dependence of 1/f Noise in Poly-emitter and Lateral BJTs” Z. Çelik, E. Zhao, F. Thiel, and R. Dutta, INVITED, 17th International Conference on Noise and Fluctuations, pp. 371-379, Prague, Czech Republic, August 18-22, 2003.
  • “The Effect of Fluctuations in the Interface Recombination Current on 1/f Noise of Gated Lateral BJTs,” G. Romas, MD M. Hoque, and Z. Çelik, SPIE Fluctuations and Noise, Noise in Devices and Circuits, Santa Fe, NM, June 1 – 4, 2003, Proc. SPIE vol. 5113, pp. 147-158, 2003, Ed: M. J. Deen, Z. Çelik and M. E. Levinshtein.
  • “Uncooled Micromachined Bolometer Arrays on Flexible Substrates,” D. P. Butler, Shadi A. Dayeh, Z. Çelik, and Patty Wisian-Neilson, SPIE Annual International Symposium on Aerospace/Defense Sensing, Simulation, and Controls (AEROSENSE); Infrared Technology and Applications XXIX, Orlando, FL, April 21-25, 2003.
  • “Surface Micromachined Microbolometers on Polyimide (PI) Substrates,” A. Mahmood, D. P. Butler, Z. Celik, TEXMEMS V, University of Texas at Arlington, Texas, May 6th, 2003.
  • “Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices,” NATO Advanced Research Workshop, Brno, Czech Republic, August 14 – 16, 2003.
  • “Noise and Reliability in Advanced Microelectronic and Nanoelectronic Devices,” IEEE-EDS Distinguished Lecture, University of Toronto, Toronto, Canada, July 22, 2003.
  • “Women Faculty in Engineering, Great Strides, Some set-Backs,” IEEE-Women in Engineering Forum, Fairmont Hotel, Dallas TX, February 12, 2003.

2002

  • “Random Telegraph Signals in Deep Sub-Micron MOSFETs,” Z. Çelik and N. V. Amarasinghe, Invited book chapter in Noise and Fluctuation Control in Electronic Devices, 2002, Editor: Alexander Balandin, ISBN: 1-58883-005-5.
  • “Investigation of Temperature Coefficient of Resistance and Crystallization of Semiconducting YBaCuO Thin Films Using Pulsed Laser Annealing,” A. Yildiz, D. P. Butler, Z. Çelik, C-U Kim, Journal of Vacuum Science and Technology B, vol. 20, pp. 548 – 553, 2002.
  • “Low-Frequency Noise In Deep-Submicron Metal-Oxide Semiconductor Field-Effect Transistors,” Z. Çelik, INVITED Special Topics on Noise in Semiconductors, IEE Proceedings on Circuits, Devices and Systems, vol. 149, pp. 23 – 31, 2002.
  • “Temperature Dependence of 1/f Noise in Polysilicon Emitter Bipolar Transistors,” E. Zhao, Z. Çelik, F. Thiel and R. Dutta, IEEE Transactions on Electron Devices, vol. 49, pp. 2230 – 2236, 2002.
  • “Uncooled Multi-Mirror Broadband Infrared Microbolometers,” M. Almasri, Z. Çelik, D. P. Butler, Alp Yaradanakul, Ali Yildiz, IEEE/ASME Journal of Microelectromechanical Systems, vol. 11, pp. 528 – 535, 2002.
  • “Uncooled Infrared Microbolometers on a Flexible Substrate,” A. Yaradanakul, D. P. Butler, and Z. Çelik, IEEE Transactions on Electron Devices, vol. 49, pp. 930 – 933, 2002.
  • “Infrared Sensors on Flexible Substrates for Smart Skin,” Z. Çelik, D. P. Butler, A. Yardanakul, A. Yildiz, SPIE Annual International Symposium on Aerospace/Defense Sensing, Simulation, and Controls (AEROSENSE): Infrared Detectors and Focal Plane Arrays VII, Ed: E. L.Dereniak, R. E. Sampson, Orlando, FL, April 1 – 5, 2002, SPIE, vol. 4721, pp. 260-268, 2002.
  • “Semiconducting YBaCuO Infrared Microbolometers on a Flexible Substrate,” A. Yildiz, Z. Çelik, and D. P. Butler, TEXMEMS IV, Lubbock, Texas, July 11th, 2002.
  • “Uncooled Semiconducting YBaCuO Microbolometers on Rough Substrates,” S. Dayeh, D. P. Butler, Z. Çelik, and Ali Yildiz, TEXMEMS IV, Lubbock, Texas, July 11th, 2002.
  • “Noise Modeling in Nanoscale Devices,” Texas Systems Day, University of Texas at Arlington, September 28, 2002.
  • “Noise and Reliability in Advanced Microelectronic and Nanoelectronic Devices,” IEEE-Maine Section, EDS Distinguished Lecture, National Semiconductor, Portland, ME, August 9, 2002.
  • “Surface Micromachined Microbolometers on Polyimide (PI) Substrates,” A. Mahmood, D. P. Butler, Z. CelikTEXMEMS V, University of Texas at Arlington, Texas, May 6th, 2003.

2001

  • “IR Detector Arrays, Uncooled,” Z. Çelik and D. P. Butler, Invited, Engineering Superconductivity, Wiley-Interscience, 2001, Editor: Peter J. Lee, ISBN: 0-471-41116-7.
  • “An Improved Physics-Based 1/f Noise Model for Deep Sub-Micron MOSFETs,” Fang Wang, and Z. Çelik, Solid State Electronics, vol. 45, pp. 351-367 2001.
  • “Dielectric loss and related noise of pyroelectric modified lead titanate arrays,” V. Leonov, D. P. Butler, Z. Çelik, K. R. Udayakumar, C. M. Hanson, and H. R. Beratan, Solid State Electronics, vol. 45, pp. 735-741, 2001.
  • “Extraction of Oxide Trap Properties Using Temperature Dependence of Random Telegraph Signals in Sub-micron MOSFETs,” N. V. Amarasinghe, Z. Çelik and A. Keshavarz, Journal of Applied Physics, vol. 89, pp. 5526-5532, 2001.
  • “Self-Supporting Infrared Microbolometers With Low-Thermal Mass,” M. Almasri, D. P. Butler, and Z. Çelik, IEEE/ASME Journal of Microelectromechanical Systems, vol. 10, pp. 469-476, 2001.
  • “Effects of Charge Quantization on Random Telegraph Signals in Deep-Sub-micron MOSFETs” Z. Çelik, INVITED, 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, Gainesville, FL, October 22 – 25, 2001.
  • “Fabrication of Micromachined Devices on Flexible Substrates,” A. Yaradanakul, A. Yildiz, D. P. Butler, and Z. Çelik, IEEE Emerging Technologies Symposium on Broad-Band Communications for the Internet Era, Richardson, TX, September 10-11, 2001.
  • “Mismatch and Flicker Noise Characterization of Tantalum Nitride Thin film Resistors for Wireless Applications,” H. Thibieroz, P. Shaner, Z. Çelik, International Conference on Microelectronic Test Structures (ICMTS), Kobe, Japan, March 20 – 22, 2001.
  • “Model for RTS Noise in Sub-micron MOSFETs” Z. Çelik, N. V. Amarasinghe, H. Thibieroz, A. Zlotnicka, 16th International Conference on Noise in Physical Systems and 1/f Fluctuations, Gainesville, FL, October 22 – 25, 2001.
  • “YBaCuO Microbolometers for Broad-band IR Sensing,” Z. Çelik, D. P. Butler, M. Almasri, A. Yardanakul, A. Yildiz, SPIE Annual International Symposium on Aerospace/Defense Sensing, Simulation, and Controls (AEROSENSE): Infrared Technology and Applications XXVII, Ed: Gabor Fulop, Orlando, FL, April 16 – 20, 2001, SPIE, vol. 4369, pp. 264-273, 2001.
  • “Room Temperature Infrared Microbolometers on a Flexible Substrate,” A. Yaradanakul, Z. Çelik, and D. P. Butler, TEXMEMS III, Dallas, Texas, June 7th, 2001.
  • “Uncooled Semiconducting YbaCuO Microbolometers for Visible through FIR Detection, M. Almasri, D. P. Butler, Z. Çelik, A. Yildiz, and A. Yaradanakul, TEXMEMS III, Dallas, Texas, June 7th, 2001.
  • “Measurements and Modeling of Random Telegraph Signals in Sub-micron MOSFETs,” IEEE Gainesville Section, EDS Distinguished Lecture, University Florida in Gainesville, FL, April 24, 2001.
  • “Noise Measurements and Modeling on Advanced Sub-Micron MOSFETs,” IEEE Electron Devices Society Distinguished Lecture, Orlando, FL, April 18, 2001..
  • “Random Telegraph Signal Noise Modeling in MOSFETs,” Compact Modeling Council, Embassy Suites Hotel, Dallas TX, March 25, 2001.
  • “Noise Modeling of Advanced MOSFETs for Mixed Signal Applications” Texas Instruments, January 17, 2001.
  • “YBaCuO microbolometers for broad-band IR sensing,” IEEE-Microwave Theory and Techniques invited speaker – Electron Devices Society Distinguished Lecture, Dallas, TX, February 21, 2001.

2000

  • “Yttrium Barium Copper Oxide as an Infrared Radiation Sensing Material” Z. Çelik, D. P. Butler and R. Sobolewski, Invited, Handbook of Advanced Electronic and Photonic Materials Vol. 3, Academic Press, 2000, Editor: H. S. Nalwa, ISBN: 0-12-513753-2.
  • “A Method for Locating the Position of Oxide Traps Responsible for Random Telegraph Signals in Sub-micron MOSFETs,” Z. Çelik, P. Vasina, N. V. Amarasinghe, IEEE Transactions on Electron Devices, vol. 47, pp. 646-648, 2000.
  • “Characterization of Oxide Traps in 0.15 mm2 MOSFETs using RTS,” N. V. Amarasinghe, Z. Çelik, P. Vasina, Microelectronics Reliability, vol. 40, pp. 1875-1881, 2000.
  • “Complex Random Telegraph Signals in 0.06 mm2 MDD n-MOSFETs,” N. V. Amarasinghe, and Z. Çelik, Solid-State Electronics, vol. 44, pp. 1013 – 1019, 2000.
  • “Effects of Quantization on RTS observed in 0.23 mm2 MOSFETs,” F. Wang, Z. Çelik, Invited, Microelectronics Reliability, vol. 40, pp. 1823 – 1831, 2000.
  • “Room Temperature Semiconducting YBaCuO Microbolometers with Ti Absorber,” A. Yaradanakul, Z. Çelik, and D. P. Butler, International Journal of Advanced Manufacturing, vol. 3(2) , pp. 13-27, 2000.
  • “Cooled and uncooled Infrared detectors based on Yttrium Barium Copper Oxide,” R. Sobolewski, D. P. Butler, Z. Çelik, Proc. The International Conference on Advanced Optical Materials and Devices, Vilnius, Lithuania, August 16 – 19, 2000.
  • “Semiconducting YBaCuO Bolometers for Uncooled IR Detection,” D.P. Butler, M. Almasri, and Z. Celik, 14th SPIE Annual International Symposium on Aerospace/Defense Sensing, Simulation, and Controls (AEROSENSE): Infrared Detectors and Focal Plane arrays VI, Ed: E. L. Dereniak, Orlando, FL, 24-28 April, 2000, SPIE, vol. 4028, pp 17-26, 2000.
  • “Temperature Dependence of RTS Noise in Sub-micron MOSFETs,” Z. Çelik and N. V. Amarasinghe,” Invited, Proc. 8th van der Ziel Symp. on Quantum 1/f Noise and Other Low-Frequency Fluctuations in Electronic Dev., St. Louis, Missouri, June 6-7, 2000.
  • “Uncooled YBaCuO Microbolometers for Advanced Broad-Band IR and FIR Radiation Detection,” D. P. Butler, and Z. Çelik, NanoSpace 2000. Proc. of NanoSpace 2000, available on CDROM by NASA. League City, Texas. January 23 – 28, 2000.
  • “Multi-color Uncooled Thermal Focal Plane Array with Thermal MEM-Chopping,” V. N. Leonov, Z. Celik and D. P. Butler, TEXMEMS II, Dallas, Texas, May 16th, 2000.
  • “Room Temperature Microbolometers with Ti Absorber,” Z. Çelik , A. Yaradanakul, , and D. P. Butler, TEXMEMS II, Dallas, Texas, May 16th, 2000.
  • “Self-Supporting Semiconducting YBaCuO Uncooled IR Detectors,” M. Almasri, D. P. Butler, and Z. Çelik, TEXMEMS II, Dallas, Texas, May 16th, 2000.
  • “Uncooled Microbolometers Based on Semiconducting YBaCuO for Broad-Band IR Radiation Detection,” D. P. Butler, Z. Çelik, M. Almasri, A. Yaradanakul, A. Yildiz, NanoTech 2000, Houston, TX, Sept. 24-28 2000.
  • “Micromachined Broad-Band Y-Ba-Cu-O Bolometers,” Z. Çelik, D. P. Butler, M. Almasri, A. Yaradanakul and A. Yildiz, IEEE MetroCon, September 27, 2000.

1999

  • “Channel Length Scaling of 1/f Noise in 0.18 mm Technology MDD n-MOSFETs,” Z. Çelik, P. Vasina, Solid State Electronics, vol. 43, pp. 1695-1701, 1999.
  • “Cryogenic Performance of Semiconducting Y-Ba-Cu-O for Infrared Detection,” M. Almasri, D. P. Butler, Z. Çelik, R. Adam, R. Sobolewski, Superconductor Science and Technology, vol. 12, pp. 751-754, 1999.
  • “MgO Sacrificial Layer for Micromachining Uncooled Y-Ba-Cu-O IR Microbolometers on Si3N4 Bridges,” J. Gray, Z. Çelik, and D. P. Butler, IEEE Journal of Microelectromechanical Systems, vol. 8, pp. 192-199, 1999.
  • “Pyroelectric Effect in Y-Ba-Cu-O Thin Films Under Laser Illumination,” D. P. Butler, Z. Çelik, R. Adam, and R. Sobolewski, Journal of Applied Physics, vol. 85, pp. 1075-1079, 1999.
  • “1/f Noise in 0.18 mm Technology MDD n-MOSFETs”, Z. Çelik, P. Vasina, Invited, Proc. Of 15th International Conference on Noise in Physical Systems and 1/f Fluctuations, pp. 331-335, Editor: C. Surya. ICNF’99, August 23 – 26, 1999. Hong Kong.
  • “Cryogenic Performance of Semiconducting Y-Ba-Cu-O for Infrared Detection,” M. Almasri, D.P. Butler, Z. Çelik, R. Adam, R. Sobolewski, International Superconductive Electronics Conference (ISEC’99) Berkeley, CA, June 21-26, 1999.
  • “Free Standing Amorphous Semiconducting YBaCuO Detectors for Uncooled IR Detection and the Effects of Doping”, M. Almasri, D. P. Butler, and Z. Çelik, SPIE 44th Annual Meeting, The International Symposium on Optical Science, Engineering and Instrumentation, Growth and Characterization of Materials for IR Detectors III, 18-23 July 1999, Denver, Co. Published in SPIE Proc. Vol. 3794:Materials and Electronics for High-Speed and Infrared Detectors, Eds: S. M. Goodnick, W. F. Kailey, R. E. Longshore, and Y. H. Zhang, pp. 66-75, 1999.
  • “Noise in Sub-Micron MOSFETs,” Z. Çelik, P. Vassina, C. Barros, Invited, Proc. 7th van der Ziel Symp. on Quantum 1/f Noise and Other Low-Frequency Fluctuations in Electronic Dev., St. Louis, Missouri, August 7-8, 1998. , AIP Conference Proceedings 466, p. 84, 1999.
  • “Uncooled Y-Ba-Cu-O detectors based on the pyroelectric and bolometric effects,” Roman Adam, Roman Sobolewski, Zeynep Çelik and Donald P. Butler, 1999 International Workshop on Superconductivity (4th Joint ISTEC/MRS Hawaii Workshop), Kauai, Hawaii, 27-30 June 1999.
  • “1/f Noise in Deep Sub-Micron MOSFETs” University of North Texas, Materials Science Department, November 10, 1999.

1998

  • “Uncooled IR Detector Arrays,” Z. Çelik and D. P. Butler, Invited, Wiley Encyclopedia of Electrical and Electronics Engineering, 1998 Edition, Editor: John G. Webster, ISBN: 0-471-13946-7.
  • “Dielectric and Pyroelectric Response in Nb/ YBaCuO /Nb Heterostructures,” J. E. Gray, Z. Çelik, D. P. Butler, Ferroelectrics, vol. 209, pp. 517-539, 1998.
  • “Micromachined YBCO Capacitor Structures as Uncooled Pyroelectric Infrared Detectors,” D. P. Butler, Z. Çelik, A. Jahanzeb, J. E. Gray, C. M. Travers, Journal of Applied Physics, vol. 84, pp. 1680-1687, 1998.
  • “Semiconducting YBaCuO Pyroelectric Infrared Detectors on Suspended Si3N4 Films,” J. Gray, D. P. Butler, and Z. Çelik, Electronic Letters, vol. 34, pp. 2164-2166, 1998.
  • “IR Detection at Room Temperature Using Semiconducting YBaCuO,” D. P. Butler, A. Jahanzeb, P. C. Shan, C. M. Travers, Z. Çelik, SPIE CD-ROM series, Vol 1: Infrared Technology. edited by Dr. Glenn D. Boreman, 1998.
  • “Room Temperature Operation of a YBaCuO Microbolometer,” Z. Çelik, D. P. Butler, A. Jahanzeb, C. M. Travers, J. E. Gray, SPIE CD-ROM series, Vol 1: Infrared Technology. edited by Dr. Glenn D. Boreman, 1998.
  • “Uncooled Infrared Microbolometers and Pyroelectric Detectors Using Semiconducting YBCO,” J. E. Gray, Z. Çelik, D. P. Butler, A. Jahanzeb, SPIE 43rd Annual Meeting, The International Symposium on Optical Science, Engineering and Instrumentation, Infrared Technology and Applications XXIV, July 19 – 24, 1998, San Diego, CA. Published in SPIE Proc. Vol. 3436: Infrared Technology and Applications XXIV, Eds: B. F. Andresen and M. Strojnik, pp. 555-566, 1998.
  • “Infrared Detection Research at SMU”, Sigma Xi Lecture Series Invited Speaker, December 2, 1998, Dallas TX.
  • “Noise in Semiconductor Devices” IEEE TechCon’98 Region 5, April 17, 1998, Forth Worth, TX.

1997

  • “A Semiconductor YBaCuO Microbolometer for Room Temperature IR Imaging,” A. Jahanzeb, C. M. Travers, Z. Çelik, D. P. Butler, and S. Tan, IEEE Transactions on Electron Devices, vol. 44, pp. 1795-1801, 1997.
  • “Charge Transport in Amorphous and Tetragonal Semiconducting YBaCuO Thin Films,” Z. Çelik, P. C. Shan, D. P. Butler, A. Jahanzeb, C. M. Travers, W. Kula, R. Sobolewski, Solid-State Electronics, vol. 41, pp. 895-899, 1997.
  • “Fabrication of Semiconducting YBaCuO Surface Micromachined Bolometer Arrays, ” C. M. Travers, A. Jahanzeb, D. P. Butler, Z. Çelik, IEEE/ASME Journal of Microelectromechanical Systems, vol. 6, pp. 271-276, 1997.
  • “Hall-Effect in Semiconducting Epitaxial and Amorphous Y-Ba-Cu-O Thin Films,” P. C. Shan, A. Jahanzeb, D. P. Butler, Z. Çelik, W. Kula, and R. Sobolewski, Journal of Applied Physics, vol. 81, pp. 6866-6873, 1997
  • “Strong Pyroelectric Response in Semiconducting Y-Ba-Cu-O and its Application to Uncooled Infrared Detection,” A. Jahanzeb, C. M. Travers, D. P. Butler, Z. Çelik, J. E. Gray. Applied Physics Letters, vol. 70, pp. 3495-3497, 1997.
  • “Noise in Semiconducting YBaCuO Microbolometers and its Implications,” Z. Çelik, A. Jahanzeb, D. P. Butler, C. M. Travers, Proc. Of 14th International Conference on Noise in Physical Systems and 1/f Fluctuations, Editors: C. Claeys and E. Simoen. pp. 309-312. ICNF’97, July 14 – 18, 1997. Leuven, Belgium.
  • “Room Temperature Operation of a YBaCuO Microbolometer,” Z. Çelik, D. P. Butler, A. Jahanzeb, C. M. Travers, J. E. Gray, SPIE’s Photonics West’97, International Symposium on Photodetectors: Materials and Devices II, February 8 – 14, 1997, San Jose, CA, Published in SPIE Proc. Vol. 2999, Photodetectors: Materials and Devices II, Eds: G. J. Brown, M. Razeghi, 1997.

1996

  • “1/f Noise as an Electromigration Characterization Tool for W-plug Vias Between TiN/Al-Cu/TiN Metallizations,” Z. Çelik, Solid-State Electronics, vol. 39, p. 999, 1996.
  • “1/f Noise and Electromigration in Multi-layered Via Structures,” R. Zhang, Z. Çelik, N. Patel, Solid-State Electronics, vol. 39, p. 281, 1996.
  • “1/f Noise and Dark Current Components in HgCdTe MIS Detectors,” W. He, and Z. Çelik, Solid-State Electronics, vol. 39, p. 127, 1996.
  • “IR Detection at Room Temperature Using Semiconducting YBaCuO,” D. P. Butler, A. Jahanzeb, P. C. Shan, C. Travers, Z. Çelik, SPIE’s International Symposium on Optical Science, Engineering, and Instrumentation, August 4-9, 1996, Denver, CO, published in SPIE Proc. Vol. 2816, Infrared Detectors for Remote Sensing: Physics, Material and Devices, Eds: R.E. Longshore and J. W. Baar, pp. 46-57, 1996.
  • “Semiconducting YBaCuO Films for Room Temperature Bolometric Applications,” A. Jahanzeb, Z. Çelik, D. P. Butler, P. C. Shan, 1996 Spring Meeting of the Materials Research Society, April 8 – 12, 1996, San Francisco, California.
  • “Infrared Imaging Research at Southern Methodist University,” Technical Club of Dallas, November 19, 1996, Dallas, TX.

1995

  • “Semiconducting YBaCuO Thin Films for Uncooled Bolometers,” P. C. Shan, Z. Çelik, D. P. Butler and A. Jahanzeb, Journal of Applied Physics, vol. 78, p. 7334, 1995. (19)
  • “Studies and Implications of the Hall-Effect in Superconducting and Semiconducting YBa2Cu3O7-d Thin Films,” A. Jahanzeb, P.C. Shan, Z. Çelik and D. P. Butler, Journal of Applied Physics, vol. 78, p. 6658, 1995.
  • “1/f Noise Measurements as a Characterization and Testing Technique in Solid-State Devices” Z. Çelik, A. Jahanzeb, W. He, R. Zhang, J. on Communications, vol. 46, p. 11, 1995.
  • “Low-Frequency Noise and Hall Effect Studies on YBa2Cu3O7-d Thin Films,” A. Jahanzeb and Z. Çelik, IEEE Tran. on Applied Superconductivity, vol. 5, p. 1416, 1995.
  • “Temperature Dependence of 1/f Fluctuations in HgCdTe MIS Infrared Detectors,” W. He, Z. Çelik, IEEE Tran. Electron Devices, vol. 42, p. 160, 1995.
  • “Low-Frequency Fluctuations in Semiconducting and Superconducting YBa2Cu3Ox Thin Films,” A. Jahanzeb, P. C. Shan, Z. Çelik and D. P. Butler, Proc. 13th International Conf. on Noise in Physical Systems and 1/f Fluctuations, pp. 115-118, Ed.: V. Bareikis, R. Katilius, May 29-June 2, 1995, Palanga, Lithuania.
  • “Low-Frequency Noise and Tunneling Currents in HgCdTe MIS Infrared Detectors,” W. He and Z. Çelik, Proc. 13th International Conf. on Noise in Physical Systems and 1/f Fluctuations, pp. 499-502, Ed.: V. Bareikis, R. Katilius, May 29-June 2, 1995, Palanga, Lithuania.
  • “Infrared Detection with Semiconducting YBaCuO,” Z. Çelik, Invited Contributor, National Science Foundation Conference on Women & Science, December 13 – 15, 1995, Washington DC.

1994

  • “Modeling of High-Tc Superconductor Parametric Amplifiers and Mixers,” J. Wang, D. P. Butler, and Z. Çelik, Physica C, vol. 231, p. 272, 1994.
  • “1/f Noise and Hall Effect Studies on YBa2Cu3O7-d Thin Films,” A. Jahanzeb and Z. Çelik, 1994 Applied Superconductivity Conf., October 16 – 21, 1994, Boston, MA.
  • “Detection of Via Electromigration in VLSI Circuit Metallizations by 1/f Noise Measurements” R. Zhang, Z. Çelik, Proc. 6th van der Ziel Symp. on Quantum 1/f Noise and Other Low-Frequency Fluctuations in Electronic Dev., St. Louis, Missouri, May 27-28, 1994, AIP Conference Proceedings 371, p. 70, 1994.
  • “Dark Current Dependence of 1/f Noise in HgCdTe MIS Infrared Detectors,” W. He, Z. Çelik, March Meeting of the American Physical Society, Pittsburgh, PA, March 21–25, 1994. Bulletin of the American Physical Society, vol. 39, p. 759, 1994.

1993

  • “1/f Noise in HgCdTe Metal-Insulator-Semiconductor Infrared Detectors,” W. He and Z. Çelik, J. Vacuum Science Technology B, vol. 11, p. 1833, 1993.
  • “A 1/f Noise Model Based on Fluctuating Defect States,” S. R. Borrello and Z. Çelik, Solid-State Electronics, vol. 36, p. 407, 1993.
  • “Conversion Gain and Noise of YBa2Cu3O7 Weak-Link Mixers” D. P. Butler, J. Wang, A. Bhandari and Z. Çelik, IEEE Transactions on Applied Superconductivity, vol. 3, p. 2269, 1993.
  • “Two-Level Noise Switching in YBa2Cu3O7 Microbridges,” D. P. Butler, Z. Çelik and J. Wang, Solid-State Electronics, vol. 36, p. 1507, 1993.
  • “Low – Frequency Noise Measurements as a Characterization and Testing Tool in Microelectronics,” Z. Çelik, INVITED, 12th International Conf. on Noise in Physical Systems and 1/f Fluctuations, August 16 – 20 1993, St. Louis, MO, AIP Conference Proceedings 285, p. 200, 1993.
  • “Sources of 1/f Noise in HgCdTe Integrating MIS Capacitors,” W. He, Z. Çelik, 12th International Conf. on Noise in Physical Systems and 1/f Fluctuations, August 16 – 20 1993, St. Louis, MO, AIP Conference Proceedings 285, p. 437, 1993.
  • “Extraction of HgCdTe-ZnS Interface Trap Density in MIS Capacitors Using 1/f Noise Measurements.” W. He and Z. Çelik, March Meeting of the American Physical Society, March 22- 26, 1993, Seattle, WA. Bulletin of the American Physical Society, vol. 38, p. 644, 1993.
  • “Frequency Conversion with High-Tc Superconducting Microbridges,” J. Wang, D. P. Butler, and Z. Çelik, March Meeting of the American Physical Society, March 22- 26, 1993, Seattle, WA. Bulletin of the American Physical Society, vol. 38, p. 688, 1993.
  • “Low – Frequency Noise Measurements as a Characterization and Testing Tool in Microelectronics,” Z. Çelik, 12th International Conf. on Noise in Physical Systems and 1/f Fluctuations, August 16 – 20 1993, St. Louis, MO.

1992

  • “Conversion Loss of a YBa2Cu3O7 Grain Boundary Mixer at 20 GHz,” D. P. Butler, J. Wang, W. Yang, A. Bhandari and Z. Çelik, Applied Physics Letters, vol. 61, p. 333, 1992.
  • “Measurements of Noise and Temperature Coefficient of Resistance on YBaCuO Thin Films in Magnetic Field,” Z. Çelik, W. Yang and D. P. Butler, Applied Physics Letters, vol. 60, p. 246, 1992.
  • “Prediction of Electromigration Failure in W / Al-Cu VLSI Interconnections by 1/f Noise Measurements,” Z. Çelik and M. Ye, Solid-State Electronics, vol. 35, p. 1209, 1992.
  • “Conversion Gain and Noise of YBa2Cu3O7 Weak-Link Mixers,” D. P. Butler, J. Wang, A. Bhandari, Z. Çelik, 1992 Applied Superconductivity Conference, Chicago, Illinois, Aug. 23 – 28, 1992.
  • “Investigation of Low-Frequency Noise and Electromigration Failure in Multilayered Metallizations,” Z. Çelik, Proc. 5th van der Ziel Symp. on Quantum 1/f Noise and Other Low-Frequency Fluctuations in Electronic Dev., St. Louis, Missouri, May 22-23, 1992, AIP Conference Proceedings 282, p. 49, 1992.
  • “Microwave Mixing with YBa2Cu3O7 Microbridges”, D. P. Butler, J. Wang, A. Bhandari, Z. Çelik, 1992 Spring Meeting of the American Physical Society Texas Section, San Marcos, Texas, March 6-7, 1992. Bulletin of the American Physical Society, vol. 37, p. 1901, December 1992.

1991

  • “A Model for Electromigration and Low-Frequency Noise in Thin Metal Films,” Z. Çelik and W. Yang, Solid State Electronics, vol. 34, p. 911, 1991.
  • “Characterization of Electromigration Parameters in VLSI Metallizations by 1/f Noise Measurements,” Z. Çelik, W. Yang, H. H. Hoang and W. R. Hunter, Solid State Electronics, vol. 34, p. 185, 1991.
  • “Characterization of YBa2Cu3O7-d Thin Films Using Low-Frequency Noise Measurements,” S. M. Alamgir, Z. Çelik, W. Yang, J. Wang, and D. P. Butler, The Electrochemical Society-American Vacuum Society 10th Annual Symp. Electronic Materials, Processing and Characterization, Dallas, Texas, June 3-4, 1991.
  • “Low-Frequency Noise Measurements on YBa2Cu3O7-d Thin Films,” Z. Çelik, S. M. Alamgir, W. Yang, J. Wang, and D. P. Butler, Proc. 1991 International Conference on Noise in Physical Systems and 1/f Fluctuations, p. 27, Ed. T. Musha, S. Sato, M. Yamamoto, Kyoto, Japan, Nov. 24-27, 1991.

1990

  • “1/f Noise in HgCdTe Field-Effect Transistors,” Z. Çelik, S. Alamgir and S. R. Borrello, Solid State Electronics, vol. 33, p. 585, 1990.
  • “Reply to ‘Comments on ‘Determination of Si-SiO2 Interface Trap Density by 1/f Noise Measurements”,” Z. Çelik and T. Y. Hsiang, IEEE Tran. Electron Devices, vol. 37, p. 825, 1990.
  • “A Model for Electromigration and Low-Frequency Noise in Thin Metal Films,” W. Yang, and Z. Çelik, The Electrochemical Society-American Vacuum Society 9th Annual Symp. Electronic Materials, Processing and Characterization, Dallas, Texas, June 4-5, 1990.
  • “Characterization of YBa2Cu3O7-d Thin Films By Low-Frequency Noise Measurements,” S. M. Alamgir, Z. Çelik, W. Yang, J. Wang, and D. P. Butler, 1990 Applied Superconductivity Conference, Snowmass Village, Colorado, Sep. 24-28, 1990.
  • “Characterization of HgCdTe-ZnS Interface by Low-Frequency Noise Measurements,” S. Alamgir, and Z. Çelik, March Meeting of the American Physical Society, March 11-16, 1990. Bulletin of the American Physical Society, vol.. 35, p. 520, 1990.
  • “The Theory of Electromigration and 1/fg Noise in Thin Metal Films,” W. Yang, and Z. Çelik, March Meeting of the American Physical Society, March 11-16, 1990. Bulletin of the American Physical Society, vol. 35, p. 444, 1990.

1989

  • “Characterization of Electromigration in VLSI Metallization Layers by Low-Frequency Noise Measurements,” Z. Çelik and W. Yang, The Electrochemical Society-American Vacuum Society 8th Annual Symp. Electronic Materials, Processing and Characterization, Dallas, Texas, June 5-6, 1989.
  • “Detection of Electromigration in VLSI Metallization Layers by Low-Frequency Noise Measurements,” Z. Çelik, W. Yang, H. H. Hoang, W. R. Hunter, IEEE 1989 International Electron Devices Meeting (IEDM) Technical Digest, p. 681, 1989.

1988

  • “Determination of Si-SiO2 Interface Trap Density by 1/f Noise Measurements,” Z. Çelik and T. Y. Hsiang, IEEE Tran. Electron Devices, vol. 35, p. 1651, 1988.
  • “Spatial Correlation Measurements of 1/f Noise in Semiconductors,” Z. Çelik and T. Y. Hsiang, Solid-State Electronics, vol. 31, p. 241, 1988.
  • “Determination of Si-SiO2 Interface Properties by Low-Temperature 1/f Noise Measurements,” Z. Çelik, The Electrochemical Society-American Vacuum Society 7th Annual Symp. Electronic Materials, Processing and Characterization, Dallas, Texas, June 6-7, 1988.

1987

  • “Spectral Dependence of 1/fg Noise on Gate Bias in N-MOSFETs,” Z. Çelik and T. Y. Hsiang, Solid-State Electronics, vol. 30, p. 419, 1987.

1985

  • “Study of 1/f Noise in N-MOSFETs: Linear Region,” Z. Çelik and T. Y. Hsiang, IEEE Tran. Electron Devices, vol. ED-32, p. 2797, 1985.
  • “1/f Noise Measurements in Short Channel MOSFETs,” Z. Çelik and T. Y. Hsiang, March Meeting of the American Physical Society, Baltimore, Maryland, March 25–29, 1985. Bulletin of the American Physical Society, vol. 30, p. 611, 1985.
  • “Gate Bias Dependence of 1/f Noise in N-Channel MOSFETs,” Z. Çelik, Conf. IEEE Electron Device Activities in Western New York, Rochester, NY, 8 October 1985.